In light of the success of 3D printing using fused-deposition modeling or higher-resolution variants with lasers applicable to polymers and metals, an analogous approach exists on the nanometer scale. With the aid of focused particle beam-induced deposition (FPBID) it is possible to create solid-state structures on the nanoscale. However, in contrast with large-scale 3D printing of plastic or metallic structures, FPBID provides nanomaterials with a wealth of interesting electronic, optical and magnetic properties. Due to this, focused electron beam-induced deposition (FEBID) has experienced a rapid expansion in the breadth of its application fields over the last 10 years. A more recent development that may help to alleviate the resolution-limiting issues in FEBID on solid substrates is the employment of helium ion microscopy. In its current development stage, it is mainly used for imaging applications, providing enhanced contrast for surface features as compared to scanning electron microscopy.