Advanced atomic force microscopy techniques III
University of Basel
See also the Thematic Series:
Advanced atomic force microscopy techniques IV
Noncontact atomic force microscopy III
Advanced atomic force microscopy techniques III
- Thilo Glatzel and
- Thomas Schimmel
Beilstein J. Nanotechnol. 2016, 7, 1052–1054, doi:10.3762/bjnano.7.98
Modification of a single-molecule AFM probe with highly defined surface functionality
- Fei Long,
- Bin Cao,
- Ashok Khanal,
- Shiyue Fang and
- Reza Shahbazian-Yassar
Beilstein J. Nanotechnol. 2014, 5, 2122–2128, doi:10.3762/bjnano.5.221
Modeling viscoelasticity through spring–dashpot models in intermittent-contact atomic force microscopy
- Enrique A. López-Guerra and
- Santiago D. Solares
Beilstein J. Nanotechnol. 2014, 5, 2149–2163, doi:10.3762/bjnano.5.224
High-frequency multimodal atomic force microscopy
- Adrian P. Nievergelt,
- Jonathan D. Adams,
- Pascal D. Odermatt and
- Georg E. Fantner
Beilstein J. Nanotechnol. 2014, 5, 2459–2467, doi:10.3762/bjnano.5.255
Accurate, explicit formulae for higher harmonic force spectroscopy by frequency modulation-AFM
- Kfir Kuchuk and
- Uri Sivan
Beilstein J. Nanotechnol. 2015, 6, 149–156, doi:10.3762/bjnano.6.14
Increasing throughput of AFM-based single cell adhesion measurements through multisubstrate surfaces
- Miao Yu,
- Nico Strohmeyer,
- Jinghe Wang,
- Daniel J. Müller and
- Jonne Helenius
Beilstein J. Nanotechnol. 2015, 6, 157–166, doi:10.3762/bjnano.6.15
Kelvin probe force microscopy in liquid using electrochemical force microscopy
- Liam Collins,
- Stephen Jesse,
- Jason I. Kilpatrick,
- Alexander Tselev,
- M. Baris Okatan,
- Sergei V. Kalinin and
- Brian J. Rodriguez
Beilstein J. Nanotechnol. 2015, 6, 201–214, doi:10.3762/bjnano.6.19
![[Graphic 6]](/bjnano/content/inline/2190-4286-6-19-i11.png?max-width=637&scale=1.18182)
response collected 200 nm above a grounded Au electrode in (a, b, c) air, (d, e, f) decane an...
![[Graphic 22]](/bjnano/content/inline/2190-4286-6-19-i27.png?max-width=637&scale=1.18182)
spectra [bias-on] collected 500 nm above HOPG in aqueous solutions of increasing salt concent...
![[Graphic 25]](/bjnano/content/inline/2190-4286-6-19-i30.png?max-width=637&scale=1.18182)
spectra [bias-on] collected 500 nm above (a) HOPG and (b) Au in milli-Q water (vertical color...
![[Graphic 27]](/bjnano/content/inline/2190-4286-6-19-i32.png?max-width=637&scale=1.18182)
spectra [bias-on] recorded 500 nm above a HOPG/Au boundary in milli-Q water. T...
Dynamic force microscopy simulator (dForce): A tool for planning and understanding tapping and bimodal AFM experiments
- Horacio V. Guzman,
- Pablo D. Garcia and
- Ricardo Garcia
Beilstein J. Nanotechnol. 2015, 6, 369–379, doi:10.3762/bjnano.6.36
Influence of spurious resonances on the interaction force in dynamic AFM
- Luca Costa and
- Mario S. Rodrigues
Beilstein J. Nanotechnol. 2015, 6, 420–427, doi:10.3762/bjnano.6.42
Mapping of elasticity and damping in an α + β titanium alloy through atomic force acoustic microscopy
- M. Kalyan Phani,
- Anish Kumar,
- T. Jayakumar,
- Walter Arnold and
- Konrad Samwer
Beilstein J. Nanotechnol. 2015, 6, 767–776, doi:10.3762/bjnano.6.79
Capillary and van der Waals interactions on CaF2 crystals from amplitude modulation AFM force reconstruction profiles under ambient conditions
- Annalisa Calò,
- Oriol Vidal Robles,
- Sergio Santos and
- Albert Verdaguer
Beilstein J. Nanotechnol. 2015, 6, 809–819, doi:10.3762/bjnano.6.84
Stick–slip behaviour on Au(111) with adsorption of copper and sulfate
- Nikolay Podgaynyy,
- Sabine Wezisla,
- Christoph Molls,
- Shahid Iqbal and
- Helmut Baltruschat
Beilstein J. Nanotechnol. 2015, 6, 820–830, doi:10.3762/bjnano.6.85
Stiffness of sphere–plate contacts at MHz frequencies: dependence on normal load, oscillation amplitude, and ambient medium
- Jana Vlachová,
- Rebekka König and
- Diethelm Johannsmann
Beilstein J. Nanotechnol. 2015, 6, 845–856, doi:10.3762/bjnano.6.87
Graphene on SiC(0001) inspected by dynamic atomic force microscopy at room temperature
- Mykola Telychko,
- Jan Berger,
- Zsolt Majzik,
- Pavel Jelínek and
- Martin Švec
Beilstein J. Nanotechnol. 2015, 6, 901–906, doi:10.3762/bjnano.6.93
![[Graphic 1]](/bjnano/content/inline/2190-4286-6-93-i1.png?max-width=637&scale=1.18182)
× 6Automatic morphological characterization of nanobubbles with a novel image segmentation method and its application in the study of nanobubble coalescence
- Yuliang Wang,
- Huimin Wang,
- Shusheng Bi and
- Bin Guo
Beilstein J. Nanotechnol. 2015, 6, 952–963, doi:10.3762/bjnano.6.98
Optimization of phase contrast in bimodal amplitude modulation AFM
- Mehrnoosh Damircheli,
- Amir F. Payam and
- Ricardo Garcia
Beilstein J. Nanotechnol. 2015, 6, 1072–1081, doi:10.3762/bjnano.6.108
Probing fibronectin–antibody interactions using AFM force spectroscopy and lateral force microscopy
- Andrzej J. Kulik,
- Małgorzata Lekka,
- Kyumin Lee,
- Grazyna Pyka-Fościak and
- Wieslaw Nowak
Beilstein J. Nanotechnol. 2015, 6, 1164–1175, doi:10.3762/bjnano.6.118
Tattoo ink nanoparticles in skin tissue and fibroblasts
- Colin A. Grant,
- Peter C. Twigg,
- Richard Baker and
- Desmond J. Tobin
Beilstein J. Nanotechnol. 2015, 6, 1183–1191, doi:10.3762/bjnano.6.120
Nano-contact microscopy of supracrystals
- Adam Sweetman,
- Nicolas Goubet,
- Ioannis Lekkas,
- Marie Paule Pileni and
- Philip Moriarty
Beilstein J. Nanotechnol. 2015, 6, 1229–1236, doi:10.3762/bjnano.6.126
![[Graphic 1]](/bjnano/content/inline/2190-4286-6-126-i1.png?max-width=637&scale=1.18182)
= 20 pA, ...
Atomic force microscopy as analytical tool to study physico-mechanical properties of intestinal cells
- Christa Schimpel,
- Oliver Werzer,
- Eleonore Fröhlich,
- Gerd Leitinger,
- Markus Absenger-Novak,
- Birgit Teubl,
- Andreas Zimmer and
- Eva Roblegg
Beilstein J. Nanotechnol. 2015, 6, 1457–1466, doi:10.3762/bjnano.6.151
Lower nanometer-scale size limit for the deformation of a metallic glass by shear transformations revealed by quantitative AFM indentation
- Arnaud Caron and
- Roland Bennewitz
Beilstein J. Nanotechnol. 2015, 6, 1721–1732, doi:10.3762/bjnano.6.176
A simple method for the determination of qPlus sensor spring constants
- John Melcher,
- Julian Stirling and
- Gordon A. Shaw
Beilstein J. Nanotechnol. 2015, 6, 1733–1742, doi:10.3762/bjnano.6.177
![[Graphic 9]](/bjnano/content/inline/2190-4286-6-177-i28.png?max-width=637&scale=1.18182)
vs b is plotted where kI is the spring constan...
Electrospray deposition of organic molecules on bulk insulator surfaces
- Antoine Hinaut,
- Rémy Pawlak,
- Ernst Meyer and
- Thilo Glatzel
Beilstein J. Nanotechnol. 2015, 6, 1927–1934, doi:10.3762/bjnano.6.195
