Correction: Extracting viscoelastic material parameters using an atomic force microscope and static force spectroscopy - Parvini, Cameron H.; Saadi, M. A. S. R.; Solares, Santiago D. (Beilstein Journal of Nanotechnology, 2021)
Keywords: atomic force microscopy (AFM); creep; force mapping; indentation; Kelvin–Voigt; static force spectroscopy (SFS); viscoelasticity