Beilstein Arch. 2020, 202059. https://doi.org/10.3762/bxiv.2020.59.v1
Published 08 May 2020
Surface nanobubbles (NBs) play an important role in various practical applications, such as mineral flotation and separation, drag reduction, and nanostructured surface fabrication. Until now, it still remains as a challenge to identify surface NBs from other spherical-cap-liked nano-objects, like blisters and nanodroplets (NDs). Here we focus on the distinctions of NBs from NDs and blisters using an atomic force microscopy. It is implemented through morphological characterization, high load scanning, and force spectroscopy measurement. In the morphological characterization experiment, contact angles of the three types of nano-objects were compared. In the high load scanning experiment, the response of the nano-objects to high scanning loads was studied. The mobility, deformability, and volume change of the nano-objects during the high load scanning were investigated. At last, the force spectroscopy measurement was implemented. Due to the existence of the three-phase contact lines on both tip-NB and tip-ND interactions, force-distance curves exhibit the similar behaviors on both NBs and NDs. However, quantitative analysis shows that the extracted parameters from force-distance curves can be used to distinguish one from the other. This study developed a systematic way to distinguish surface NBs from others nano-objects, which is crucial for surface nanobubble community.
Keywords: nanobubbles; blisters; nanodroplets; morphological characterization; force spectroscopy measurement; atomic force microscopy.
Format: PDF | Size: 966.4 KB | Download |
When a peer-reviewed version of this preprint is available, this information will be updated in the information box above. If no peer-reviewed version is available, please cite this preprint using the following information:
Li, X.; Zeng, B.; Ren, S.; Wang, Y. Beilstein Arch. 2020, 202059. doi:10.3762/bxiv.2020.59.v1
Citation data can be downloaded as file using the "Download" button or used for copy/paste from the text window below.
Citation data in RIS format can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and
Zotero.
© 2020 Li et al.; licensee Beilstein-Institut.
This is an Open Access article under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/4.0). Please note that the reuse, redistribution and reproduction in particular requires that the authors and source are credited.
The license is subject to the Beilstein Archives terms and conditions: (https://www.beilstein-archives.org/xiv/terms)