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Cite the Following Article
Influence of dielectric layer thickness and roughness on topographic effects in magnetic force microscopy
Alexander Krivcov, Jasmin Ehrler, Marc Fuhrmann, Tanja Junkers and Hildegard Möbius
Beilstein J. Nanotechnol. 2019, 10, 1056–1064.
https://doi.org/10.3762/bjnano.10.106
How to Cite
Krivcov, A.; Ehrler, J.; Fuhrmann, M.; Junkers, T.; Möbius, H. Beilstein J. Nanotechnol. 2019, 10, 1056–1064. doi:10.3762/bjnano.10.106
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