Supporting Information
| Supporting Information File 1: The effect of varying the Lens 2 voltage on the BN deflection pattern. | ||
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| Supporting Information File 2: The effect of varying the Lens 2 voltage on the MgO deflection pattern. | ||
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| Supporting Information File 3: Description of supporting videos 1 and 2, SIMION results and methods (defocus and size on sample plane), a defocus series for a polycrystalline silicon sample, a magnification of images showing distortion of grid squares and a photograph of the THIM instrument. | ||
| Format: PDF | Size: 1.0 MB | Download |
Cite the Following Article
Stationary beam full-field transmission helium ion microscopy using sub-50 keV He+: Projected images and intensity patterns
Michael Mousley, Santhana Eswara, Olivier De Castro, Olivier Bouton, Nico Klingner, Christoph T. Koch, Gregor Hlawacek and Tom Wirtz
Beilstein J. Nanotechnol. 2019, 10, 1648–1657.
https://doi.org/10.3762/bjnano.10.160
How to Cite
Mousley, M.; Eswara, S.; De Castro, O.; Bouton, O.; Klingner, N.; Koch, C. T.; Hlawacek, G.; Wirtz, T. Beilstein J. Nanotechnol. 2019, 10, 1648–1657. doi:10.3762/bjnano.10.160
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