A novel method to remove impulse noise from atomic force microscopy images based on Bayesian compressed sensing

Yingxu Zhang, Yingzi Li, Zihang Song, Zhenyu Wang, Jianqiang Qian and Junen Yao
Beilstein J. Nanotechnol. 2019, 10, 2346–2356. https://doi.org/10.3762/bjnano.10.225

Cite the Following Article

A novel method to remove impulse noise from atomic force microscopy images based on Bayesian compressed sensing
Yingxu Zhang, Yingzi Li, Zihang Song, Zhenyu Wang, Jianqiang Qian and Junen Yao
Beilstein J. Nanotechnol. 2019, 10, 2346–2356. https://doi.org/10.3762/bjnano.10.225

How to Cite

Zhang, Y.; Li, Y.; Song, Z.; Wang, Z.; Qian, J.; Yao, J. Beilstein J. Nanotechnol. 2019, 10, 2346–2356. doi:10.3762/bjnano.10.225

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