Scanning transmission imaging in the helium ion microscope using a microchannel plate with a delay line detector

Scholarly Works

• Petrov, Y. V.; Vyvenko, O. F. Field Ion Sources for Research and Modification of the Structure of Amorphous and Crystalline Materials. Crystallography Reports 2024, 69, 2–15. doi:10.1134/s1063774523601193
• Петров, Ю. В.; Вывенко, О. Ф. Автоионные источники для исследования и модификации структуры аморфных и кристаллических материалов. Kristallografiâ 2024, 69, 5–20. doi:10.31857/s0023476124010029
• Höflich, K.; Hobler, G.; Allen, F. I.; Wirtz, T.; Rius, G.; McElwee-White, L.; Krasheninnikov, A. V.; Schmidt, M.; Utke, I.; Klingner, N.; Osenberg, M.; Córdoba, R.; Djurabekova, F.; Manke, I.; Moll, P.; Manoccio, M.; De Teresa, J. M.; Bischoff, L.; Michler, J.; De Castro, O.; Delobbe, A.; Dunne, P.; Dobrovolskiy, O. V.; Frese, N.; Gölzhäuser, A.; Mazarov, P.; Koelle, D.; Möller, W.; Pérez-Murano, F.; Philipp, P.; Vollnhals, F.; Hlawacek, G. Roadmap for focused ion beam technologies. Applied Physics Reviews 2023, 10. doi:10.1063/5.0162597
• Mousley, M.; Andersen, D.; Wirtz, T.; Eswara, S. 5D-TOF-STIM Imaging with a Low-energy He+ Focused Ion Beam. Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada 2023, 29, 530–531. doi:10.1093/micmic/ozad067.249
• De Castro, O.; Taubitz, T.; Biesemeier, A.; Wirtz, T. Getting Structural and Compositional Insights into Biological and Beam Sensitive Samples Using Three Complementary Detection Modalities on a Cryo-FIB Instrument. Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada 2023, 29, 785–786. doi:10.1093/micmic/ozad067.390
• Wilhelm, R. A. The charge exchange of slow highly charged ions at surfaces unraveled with freestanding 2D materials. Surface Science Reports 2022, 77, 100577. doi:10.1016/j.surfrep.2022.100577
• Eswara, S.; Tabean, S.; Mousley, M.; Hoang, Q. H.; Bouton, O.; De Castro, O.; Serralta, E.; Klingner, N.; Hlawacek, G.; Wirtz, T. Contrast Mechanisms in Transmission Microscopy Using keV Helium Ions. Microscopy and Microanalysis 2022, 28, 34–35. doi:10.1017/s1431927622001052
• Tabean, S.; Mousley, M.; Pauly, C.; De Castro, O.; Serralta, E.; Klingner, N.; Mücklich, F.; Hlawacek, G.; Wirtz, T.; Eswara, S. Quantitative nanoscale imaging using transmission He ion channelling contrast: Proof-of-concept and application to study isolated crystalline defects. Ultramicroscopy 2021, 233, 113439. doi:10.1016/j.ultramic.2021.113439
• De Castro, O.; Biesemeier, A.; Serralta, E.; Bouton, O.; Barrahma, R.; Hoang, Q. H.; Cambier, S.; Taubitz, T.; Klingner, N.; Hlawacek, G.; Pinto, S. D.; Gnauck, P.; Lucas, F.; Bebeacua, C.; Wirtz, T. npSCOPE: A New Multimodal Instrument for In Situ Correlative Analysis of Nanoparticles. Analytical chemistry 2021, 93, 14417–14424. doi:10.1021/acs.analchem.1c02337
• Audinot, J.-N.; Philipp, P.; De Castro, O.; Biesemeier, A.; Hoang, Q. H.; Wirtz, T. Highest resolution chemical imaging based on secondary ion mass spectrometry performed on the helium ion microscope. Reports on progress in physics. Physical Society (Great Britain) 2021, 84, 105901. doi:10.1088/1361-6633/ac1e32
• Wirtz, T.; De Castro, O.; Audinot, J.-N.; Taubitz, T.; Biesemeier, A. In-situ multi-modal microscopy using finely focused ion and electron beams. Microscopy and Microanalysis 2021, 27, 308–309. doi:10.1017/s1431927621001677
• Tabean, S.; Eswara, S.; Mousley, M.; De Castro, O.; Audinot, J.-N.; Wirtz, T. New Imaging modality for surface and sub-surface imaging using Scanning Transmission Helium Ion Microscopy. Microscopy and Microanalysis 2021, 27, 770–772. doi:10.1017/s143192762100307x
• Mousley, M.; Moeller, W.; Philipp, P.; Bouton, O.; Klingner, N.; Serralta, E.; Hlawacek, G.; Wirtz, T.; Eswara, S. Transmission ion microscopy and time-of-flight spectroscopy. Microscopy and Microanalysis 2021, 27, 1930–1932. doi:10.1017/s1431927621007017
• Wirtz, T.; De Castro, O.; Hoang, H. Q.; Cressa, L.; Eswara, S.; Biesemeier, A.; Audinot, J.-N. Multimodal characterisation on FIB instruments combining nano-scale SIMS and SE imaging. Microscopy and Microanalysis 2021, 27, 1008–1010. doi:10.1017/s1431927621003810
• Holeňák, R.; Lohmann, S.; Sekula, F.; Primetzhofer, D. Simultaneous assessment of energy, charge state and angular distribution for medium energy ions interacting with ultra-thin self-supporting targets: A time-of-flight approach. Vacuum 2021, 185, 109988. doi:10.1016/j.vacuum.2020.109988
• Serralta, E.; Klingner, N.; De Castro, O.; Mousley, M.; Eswara, S.; Pinto, S. D.; Wirtz, T.; Hlawacek, G. Scanning transmission imaging in the helium ion microscope using a microchannel plate with a delay line detector. Beilstein journal of nanotechnology 2020, 11, 1854–1864. doi:10.3762/bjnano.11.167
• Holeňák, R.; Lohmann, S.; Sekula, F.; Primetzhofer, D. Simultaneous assessment of energy, charge state and angular distribution for medium energy ions interacting with ultra-thin self-supporting targets: a time-of-flight approach. 2020.

Explore citations to this article at