Cite the Following Article
Quantitative dynamic force microscopy with inclined tip oscillation
Philipp Rahe, Daniel Heile, Reinhard Olbrich and Michael Reichling
Beilstein J. Nanotechnol. 2022, 13, 610–619.
https://doi.org/10.3762/bjnano.13.53
How to Cite
Rahe, P.; Heile, D.; Olbrich, R.; Reichling, M. Beilstein J. Nanotechnol. 2022, 13, 610–619. doi:10.3762/bjnano.13.53
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- Khachatryan, K.; Anter, S.; Reichling, M.; von Schmidsfeld, A. Signal generation in dynamic interferometric displacement detection. Beilstein journal of nanotechnology 2024, 15, 1070–1076. doi:10.3762/bjnano.15.87
- Heile, D.; Olbrich, R.; Reichling, M.; Rahe, P. Modeling nanoscale charge measurements. Physical Review B 2023, 108. doi:10.1103/physrevb.108.085420
