Direct measurement of surface photovoltage by AC bias Kelvin probe force microscopy

Masato Miyazaki, Yasuhiro Sugawara and Yan Jun Li
Beilstein J. Nanotechnol. 2022, 13, 712–720. https://doi.org/10.3762/bjnano.13.63

Cite the Following Article

Direct measurement of surface photovoltage by AC bias Kelvin probe force microscopy
Masato Miyazaki, Yasuhiro Sugawara and Yan Jun Li
Beilstein J. Nanotechnol. 2022, 13, 712–720. https://doi.org/10.3762/bjnano.13.63

How to Cite

Miyazaki, M.; Sugawara, Y.; Li, Y. J. Beilstein J. Nanotechnol. 2022, 13, 712–720. doi:10.3762/bjnano.13.63

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