Comparing the performance of single and multifrequency Kelvin probe force microscopy techniques in air and water

Jason I. Kilpatrick, Emrullah Kargin and Brian J. Rodriguez
Beilstein J. Nanotechnol. 2022, 13, 922–943. https://doi.org/10.3762/bjnano.13.82

Cite the Following Article

Comparing the performance of single and multifrequency Kelvin probe force microscopy techniques in air and water
Jason I. Kilpatrick, Emrullah Kargin and Brian J. Rodriguez
Beilstein J. Nanotechnol. 2022, 13, 922–943. https://doi.org/10.3762/bjnano.13.82

How to Cite

Kilpatrick, J. I.; Kargin, E.; Rodriguez, B. J. Beilstein J. Nanotechnol. 2022, 13, 922–943. doi:10.3762/bjnano.13.82

Download Citation

Citation data can be downloaded as file using the "Download" button or used for copy/paste from the text window below.
Citation data in RIS format can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Zotero.

Presentation Graphic

Picture with graphical abstract, title and authors for social media postings and presentations.
Format: PNG Size: 8.6 MB Download

Citations to This Article

Up to 20 of the most recent references are displayed here.

Scholarly Works

  • Hackl, T.; Poik, M.; Schitter, G. Single-Harmonic Response Open-Loop Kelvin-Probe Force Microscopy. IEEE Transactions on Instrumentation and Measurement 2024, 73, 1–7. doi:10.1109/tim.2024.3366573
  • Signore, M.; Francioso, L.; De Pascali, C.; Serra, A.; Manno, D.; Rescio, G.; Quaranta, F.; Melissano, E.; Velardi, L. Improvement of the piezoelectric response of AlN thin films through the evaluation of the contact surface potential by piezoresponse force microscopy. Vacuum 2023, 218, 112596. doi:10.1016/j.vacuum.2023.112596
  • Biglarbeigi, P.; Morelli, A.; Pauly, S.; Yu, Z.; Jiang, W.; Sharma, S.; Finlay, D.; Kumar, A.; Soin, N.; Payam, A. F. Unraveling Spatiotemporal Transient Dynamics at the Nanoscale via Wavelet Transform-Based Kelvin Probe Force Microscopy. ACS nano 2023, 17, 21506–21517. doi:10.1021/acsnano.3c06488
  • Miyazaki, M.; Sugawara, Y.; Li, Y. J. Dual-bias modulation heterodyne Kelvin probe force microscopy in FM mode. Applied Physics Letters 2022, 121. doi:10.1063/5.0129433
Other Beilstein-Institut Open Science Activities