Cross-sectional Kelvin probe force microscopy on III–V epitaxial multilayer stacks: challenges and perspectives

Mattia da Lisca, José Alvarez, James P. Connolly, Nicolas Vaissiere, Karim Mekhazni, Jean Decobert and Jean-Paul Kleider
Beilstein J. Nanotechnol. 2023, 14, 725–737. https://doi.org/10.3762/bjnano.14.59

Cite the Following Article

Cross-sectional Kelvin probe force microscopy on III–V epitaxial multilayer stacks: challenges and perspectives
Mattia da Lisca, José Alvarez, James P. Connolly, Nicolas Vaissiere, Karim Mekhazni, Jean Decobert and Jean-Paul Kleider
Beilstein J. Nanotechnol. 2023, 14, 725–737. https://doi.org/10.3762/bjnano.14.59

How to Cite

da Lisca, M.; Alvarez, J.; Connolly, J. P.; Vaissiere, N.; Mekhazni, K.; Decobert, J.; Kleider, J.-P. Beilstein J. Nanotechnol. 2023, 14, 725–737. doi:10.3762/bjnano.14.59

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