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Cite the Following Article
A multi-resistance wide-range calibration sample for conductive probe atomic force microscopy measurements
François Piquemal, Khaled Kaja, Pascal Chrétien, José Morán-Meza, Frédéric Houzé, Christian Ulysse and Abdelmounaim Harouri
Beilstein J. Nanotechnol. 2023, 14, 1141–1148.
https://doi.org/10.3762/bjnano.14.94
How to Cite
Piquemal, F.; Kaja, K.; Chrétien, P.; Morán-Meza, J.; Houzé, F.; Ulysse, C.; Harouri, A. Beilstein J. Nanotechnol. 2023, 14, 1141–1148. doi:10.3762/bjnano.14.94
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Scholarly Works
- Sikora, A.; Gajewski, K.; Badura, D.; Pruchnik, B.; Piasecki, T.; Raczkowski, K.; Gotszalk, T. Conductive Atomic Force Microscopy-Ultralow-Current Measurement Systems for Nanoscale Imaging of a Surface's Electrical Properties. Sensors (Basel, Switzerland) 2024, 24, 5649. doi:10.3390/s24175649
