Supporting Information
Section S1: Height images of the scanned specimens of calibration standard grating within 10 µm × 10 µm. Section S2: Height images of the scanned corners of the calibration gate at smaller areas. Section S3: Nonlinear regression function used for determining the tip radii.
| Supporting Information File 1: Additional experimental data. | ||
| Format: PDF | Size: 978.1 KB | Download |
Cite the Following Article
Determination of the radii of coated and uncoated silicon AFM sharp tips using a height calibration standard grating and a nonlinear regression function
Perawat Boonpuek and Jonathan R. Felts
Beilstein J. Nanotechnol. 2023, 14, 1200–1207.
https://doi.org/10.3762/bjnano.14.99
How to Cite
Boonpuek, P.; Felts, J. R. Beilstein J. Nanotechnol. 2023, 14, 1200–1207. doi:10.3762/bjnano.14.99
Download Citation
Citation data can be downloaded as file using the "Download" button or used for copy/paste from the text window
below.
Citation data in RIS format can be imported by all major citation management software, including EndNote,
ProCite, RefWorks, and Zotero.
Presentation Graphic
| Picture with graphical abstract, title and authors for social media postings and presentations. | ||
| Format: PNG | Size: 11.2 MB | Download |
Citations to This Article
Up to 20 of the most recent references are displayed here.
Scholarly Works
- Fu, T.; Uzoma, P. C.; Ding, X.; Wu, P.; Penkov, O.; Hu, H. A Novel Nano-Spherical Tip for Improving Precision in Elastic Modulus Measurements of Polymer Materials via Atomic Force Microscopy. Micromachines 2024, 15, 1175. doi:10.3390/mi15091175
