Supporting Information
Cross-sectional SEM images of 60 and 120 nm WOx films, XPS spectra of 30 nm WOx film, Tauc plots of as-deposited WOx films, and linear I–V curves of as-deposited and annealed WOx films.
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Cite the Following Article
Controllable physicochemical properties of WOx thin films grown under glancing angle
Rupam Mandal, Aparajita Mandal, Alapan Dutta, Rengasamy Sivakumar, Sanjeev Kumar Srivastava and Tapobrata Som
Beilstein J. Nanotechnol. 2024, 15, 350–359.
https://doi.org/10.3762/bjnano.15.31
How to Cite
Mandal, R.; Mandal, A.; Dutta, A.; Sivakumar, R.; Srivastava, S. K.; Som, T. Beilstein J. Nanotechnol. 2024, 15, 350–359. doi:10.3762/bjnano.15.31
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