Defects in oxide surfaces studied by atomic force and scanning tunneling microscopy

Thomas König, Georg H. Simon, Lars Heinke, Leonid Lichtenstein and Markus Heyde
Beilstein J. Nanotechnol. 2011, 2, 1–14. https://doi.org/10.3762/bjnano.2.1

Cite the Following Article

Defects in oxide surfaces studied by atomic force and scanning tunneling microscopy
Thomas König, Georg H. Simon, Lars Heinke, Leonid Lichtenstein and Markus Heyde
Beilstein J. Nanotechnol. 2011, 2, 1–14. https://doi.org/10.3762/bjnano.2.1

How to Cite

König, T.; Simon, G. H.; Heinke, L.; Lichtenstein, L.; Heyde, M. Beilstein J. Nanotechnol. 2011, 2, 1–14. doi:10.3762/bjnano.2.1

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