Cite the Following Article
The atomic force microscope as a mechano–electrochemical pen
Christian Obermair, Andreas Wagner and Thomas Schimmel
Beilstein J. Nanotechnol. 2011, 2, 659–664.
https://doi.org/10.3762/bjnano.2.70
How to Cite
Obermair, C.; Wagner, A.; Schimmel, T. Beilstein J. Nanotechnol. 2011, 2, 659–664. doi:10.3762/bjnano.2.70
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- Payton, O. D.; Picco, L.; Scott, T. B. High-speed atomic force microscopy for materials science. International Materials Reviews 2016, 61, 473–494. doi:10.1080/09506608.2016.1156301
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- Huang, C.; Moosmann, M.; Jin, J.; Heiler, T.; Walheim, S.; Schimmel, T. Polymer blend lithography: A versatile method to fabricate nanopatterned self-assembled monolayers. Beilstein journal of nanotechnology 2012, 3, 620–628. doi:10.3762/bjnano.3.71
Patents
- SCHIMMEL THOMAS. Optical device and use of the device. US 10359547 B2, July 23, 2019.
- SCHIMMEL THOMAS. OPTICAL DEVICE AND USE OF THE DEVICE. WO 2016192859 A1, Dec 8, 2016.