Supporting Information
Schematic of the morphology of the studied sample, electron microscopy images of typical samples and oxygen K-edge spectrum.
| Supporting Information File 1: Additional figures. | ||
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Cite the Following Article
X-ray absorption spectroscopy by full-field X-ray microscopy of a thin graphite flake: Imaging and electronic structure via the carbon K-edge
Carla Bittencourt, Adam P. Hitchock, Xiaoxing Ke, Gustaaf Van Tendeloo, Chris P. Ewels and Peter Guttmann
Beilstein J. Nanotechnol. 2012, 3, 345–350.
https://doi.org/10.3762/bjnano.3.39
How to Cite
Bittencourt, C.; Hitchock, A. P.; Ke, X.; Van Tendeloo, G.; Ewels, C. P.; Guttmann, P. Beilstein J. Nanotechnol. 2012, 3, 345–350. doi:10.3762/bjnano.3.39
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