Cite the Following Article
Repulsive bimodal atomic force microscopy on polymers
Alexander M. Gigler, Christian Dietz, Maximilian Baumann, Nicolás F. Martinez, Ricardo García and Robert W. Stark
Beilstein J. Nanotechnol. 2012, 3, 456–463.
https://doi.org/10.3762/bjnano.3.52
How to Cite
Gigler, A. M.; Dietz, C.; Baumann, M.; Martinez, N. F.; García, R.; Stark, R. W. Beilstein J. Nanotechnol. 2012, 3, 456–463. doi:10.3762/bjnano.3.52
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