Cite the Following Article
Focused electron beam induced deposition: A perspective
Michael Huth, Fabrizio Porrati, Christian Schwalb, Marcel Winhold, Roland Sachser, Maja Dukic, Jonathan Adams and Georg Fantner
Beilstein J. Nanotechnol. 2012, 3, 597–619.
https://doi.org/10.3762/bjnano.3.70
How to Cite
Huth, M.; Porrati, F.; Schwalb, C.; Winhold, M.; Sachser, R.; Dukic, M.; Adams, J.; Fantner, G. Beilstein J. Nanotechnol. 2012, 3, 597–619. doi:10.3762/bjnano.3.70
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