Cite the Following Article
Interpreting motion and force for narrow-band intermodulation atomic force microscopy
Daniel Platz, Daniel Forchheimer, Erik A. Tholén and David B. Haviland
Beilstein J. Nanotechnol. 2013, 4, 45–56.
https://doi.org/10.3762/bjnano.4.5
How to Cite
Platz, D.; Forchheimer, D.; Tholén, E. A.; Haviland, D. B. Beilstein J. Nanotechnol. 2013, 4, 45–56. doi:10.3762/bjnano.4.5
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- Borgani, R.; Thorén, P.-A.; Forchheimer, D.; Dobryden, I.; Sah, S. M.; Claesson, P. M.; Haviland, D. B. Background-Force Compensation in Dynamic Atomic Force Microscopy. Physical Review Applied 2017, 7, 064018. doi:10.1103/physrevapplied.7.064018
- Thorén, P.-A.; de Wijn, A. S.; Borgani, R.; Forchheimer, D.; Haviland, D. B. Imaging high-speed friction at the nanometer scale. Nature communications 2016, 7, 13836. doi:10.1038/ncomms13836
- Li, Y.; Huang, Y.; Krentz, T. M.; Natarajan, B.; Neely, T.; Schadler, L. S. Interface/Interphase in Polymer Nanocomposites; Wiley, 2016; pp 1–69. doi:10.1002/9781119185093.ch1
- Haviland, D. B.; van Eysden, C. A.; Forchheimer, D.; Platz, D.; Kassa, H. G.; Leclère, P. Probing viscoelastic response of soft material surfaces at the nanoscale. Soft matter 2015, 12, 619–624. doi:10.1039/c5sm02154e
- Payam, A. F.; Martin-Jimenez, D.; Garcia, R. Force reconstruction from tapping mode force microscopy experiments. Nanotechnology 2015, 26, 185706. doi:10.1088/0957-4484/26/18/185706
- Forchheimer, D.; Borysov, S. S.; Platz, D.; Haviland, D. B. Determining surface properties with bimodal and multimodal AFM. Nanotechnology 2014, 25, 485708. doi:10.1088/0957-4484/25/48/485708
- Borysov, S. S.; Platz, D.; de Wijn, A. S.; Forchheimer, D.; Tolén, E. A.; Balatsky, A. V.; Haviland, D. B. Reconstruction of tip-surface interactions with multimodal intermodulation atomic force microscopy. Physical Review B 2013, 88, 115405. doi:10.1103/physrevb.88.115405
- Platz, D.; Forchheimer, D.; Tholén, E. A.; Haviland, D. B. Polynomial force approximations and multifrequency atomic force microscopy. Beilstein journal of nanotechnology 2013, 4, 352–360. doi:10.3762/bjnano.4.41
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Patents
- SERRY FARDAD MICHAEL. Harmonic feedback atomic force microscopy. US 9891246 B2, Feb 13, 2018.