High-frequency multimodal atomic force microscopy

Adrian P. Nievergelt, Jonathan D. Adams, Pascal D. Odermatt and Georg E. Fantner
Beilstein J. Nanotechnol. 2014, 5, 2459–2467. https://doi.org/10.3762/bjnano.5.255

Cite the Following Article

High-frequency multimodal atomic force microscopy
Adrian P. Nievergelt, Jonathan D. Adams, Pascal D. Odermatt and Georg E. Fantner
Beilstein J. Nanotechnol. 2014, 5, 2459–2467. https://doi.org/10.3762/bjnano.5.255

How to Cite

Nievergelt, A. P.; Adams, J. D.; Odermatt, P. D.; Fantner, G. E. Beilstein J. Nanotechnol. 2014, 5, 2459–2467. doi:10.3762/bjnano.5.255

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Patents

  • FANTNER GEORG ERNEST; ADAMS JONATHAN DAVID; NIEVERGELT ADRIAN PASCAL. METHOD AND APPARATUS OF USING A SCANNING PROBE MICROSCOPE. EP 4439077 A2, Oct 2, 2024.
  • SADEGHIAN MARNANI HAMED; VAN ES MAARTEN HUBERTUS; VAN NEER PAUL LOUIS MARIA JOSEPH; MEIJER TIMMERMAN THIJSSEN RUTGER. Heterodyne scanning probe microscopy method and system. US 11940416 B2, March 26, 2024.
  • FANTNER GEORG ERNEST; ADAMS JONATHAN DAVID; NIEVERGELT ADRIAN PASCAL. Method and device of using a scanning probe microscope. US 11112426 B2, Sept 7, 2021.
  • FANTNER GEORG ERNEST; ADAMS JONATHAN DAVID; NIEVERGELT ADRIAN PASCAL. METHOD AND APPARATUS OF USING A SCANNING PROBE MICROSCOPE. WO 2016181325 A1, Nov 17, 2016.
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