Cite the Following Article
Impact of thermal frequency drift on highest precision force microscopy using quartz-based force sensors at low temperatures
Florian Pielmeier, Daniel Meuer, Daniel Schmid, Christoph Strunk and Franz J. Giessibl
Beilstein J. Nanotechnol. 2014, 5, 407–412.
https://doi.org/10.3762/bjnano.5.48
How to Cite
Pielmeier, F.; Meuer, D.; Schmid, D.; Strunk, C.; Giessibl, F. J. Beilstein J. Nanotechnol. 2014, 5, 407–412. doi:10.3762/bjnano.5.48
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