Supporting Information
Supporting Information File 1: Size distribution of Au nanocrystals used in our study and scanning electron microscope images of an interfacial supracrystal. | ||
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Cite the Following Article
Nano-contact microscopy of supracrystals
Adam Sweetman, Nicolas Goubet, Ioannis Lekkas, Marie Paule Pileni and Philip Moriarty
Beilstein J. Nanotechnol. 2015, 6, 1229–1236.
https://doi.org/10.3762/bjnano.6.126
How to Cite
Sweetman, A.; Goubet, N.; Lekkas, I.; Pileni, M. P.; Moriarty, P. Beilstein J. Nanotechnol. 2015, 6, 1229–1236. doi:10.3762/bjnano.6.126
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- Glatzel, T.; Schimmel, T. Advanced atomic force microscopy techniques III. Beilstein journal of nanotechnology 2016, 7, 1052–1054. doi:10.3762/bjnano.7.98