Supporting Information
A supplementary Mathematica notebook file containing an implementation of the formulae of Table 1 for reconstruction of simulated conservative forces can be found in the ZIP file of the Supporting Information.
| Supporting Information File 1: Force reconstruction. | ||
| Format: ZIP | Size: 16.5 KB | Download |
Cite the Following Article
Accurate, explicit formulae for higher harmonic force spectroscopy by frequency modulation-AFM
Kfir Kuchuk and Uri Sivan
Beilstein J. Nanotechnol. 2015, 6, 149–156.
https://doi.org/10.3762/bjnano.6.14
How to Cite
Kuchuk, K.; Sivan, U. Beilstein J. Nanotechnol. 2015, 6, 149–156. doi:10.3762/bjnano.6.14
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Scholarly Works
- Payam, A. F. Modelling and Nanoscale Force Spectroscopy of Frequency Modulation Atomic Force Microscopy. Applied Mathematical Modelling 2020, 79, 544–554. doi:10.1016/j.apm.2019.10.051
- Ma, Y.; Liu, C. Research on Harmonic Analysis and Suppression Methods in Electrowinning Copper Rectifier. In 2019 IEEE 4th Advanced Information Technology, Electronic and Automation Control Conference (IAEAC), IEEE, 2019; pp 2718–2722. doi:10.1109/iaeac47372.2019.8997844
- Wagner, T. Steady-state and transient behavior in dynamic atomic force microscopy. Journal of Applied Physics 2019, 125, 044301. doi:10.1063/1.5078954
- Zhang, S.; Qian, J.; Li, Y.; Zhang, Y.; Wang, Z. A Novel Method to Reconstruct the Force Curve by Higher Harmonics of the First Two Flexural Modes in Frequency Modulation Atomic Force Microscope (FM-AFM). Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada 2018, 24, 256–263. doi:10.1017/s1431927618000363
- Zhiyue, Z.; Xu, R.; Ye, S.; Hussain, S.; Ji, W.; Cheng, P.; Li, Y. J.; Sugawara, Y.; Cheng, Z. High harmonic exploring on different materials in dynamic atomic force microscopy. Science China Technological Sciences 2017, 61, 446–452. doi:10.1007/s11431-017-9161-4
- Glatzel, T.; Schimmel, T. Advanced atomic force microscopy techniques III. Beilstein journal of nanotechnology 2016, 7, 1052–1054. doi:10.3762/bjnano.7.98
