Supporting Information
The Supporting Information includes Q-factor measurments for the soft cantilver and deflection noise density spectra for the NCLR cantilever.
| Supporting Information File 1: Detection noise measurement for NCLR cantilever. | ||
| Format: PDF | Size: 466.9 KB | Download |
Cite the Following Article
Improved atomic force microscopy cantilever performance by partial reflective coating
Zeno Schumacher, Yoichi Miyahara, Laure Aeschimann and Peter Grütter
Beilstein J. Nanotechnol. 2015, 6, 1450–1456.
https://doi.org/10.3762/bjnano.6.150
How to Cite
Schumacher, Z.; Miyahara, Y.; Aeschimann, L.; Grütter, P. Beilstein J. Nanotechnol. 2015, 6, 1450–1456. doi:10.3762/bjnano.6.150
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