Continuum models of focused electron beam induced processing

Milos Toth, Charlene Lobo, Vinzenz Friedli, Aleksandra Szkudlarek and Ivo Utke
Beilstein J. Nanotechnol. 2015, 6, 1518–1540. https://doi.org/10.3762/bjnano.6.157

Cite the Following Article

Continuum models of focused electron beam induced processing
Milos Toth, Charlene Lobo, Vinzenz Friedli, Aleksandra Szkudlarek and Ivo Utke
Beilstein J. Nanotechnol. 2015, 6, 1518–1540. https://doi.org/10.3762/bjnano.6.157

How to Cite

Toth, M.; Lobo, C.; Friedli, V.; Szkudlarek, A.; Utke, I. Beilstein J. Nanotechnol. 2015, 6, 1518–1540. doi:10.3762/bjnano.6.157

Download Citation

Citation data can be downloaded as file using the "Download" button or used for copy/paste from the text window below.
Citation data in RIS format can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Zotero.

Citations to This Article

Up to 20 of the most recent references are displayed here.

Scholarly Works

  • Ge, C.; Masalehdan, T.; Shojaei Baghini, M.; Duran Toro, V.; Signorelli, L.; Thomson, H.; Gregurec, D.; Heidari, H. Microfabrication Technologies for Nanoinvasive and High‐Resolution Magnetic Neuromodulation. Advanced Science 2024. doi:10.1002/advs.202404254
  • Glessi, C.; Polman, F. A.; Hagen, C. W. Water-assisted purification during electron beam-induced deposition of platinum and gold. Beilstein journal of nanotechnology 2024, 15, 884–896. doi:10.3762/bjnano.15.73
  • Solov'yov, A. V.; Verkhovtsev, A. V.; Mason, N. J.; Amos, R. A.; Bald, I.; Baldacchino, G.; Dromey, B.; Falk, M.; Fedor, J.; Gerhards, L.; Hausmann, M.; Hildenbrand, G.; Hrabovský, M.; Kadlec, S.; Kočišek, J.; Lépine, F.; Ming, S.; Nisbet, A.; Ricketts, K.; Sala, L.; Schlathölter, T.; Wheatley, A. E. H.; Solov'yov, I. A. Condensed Matter Systems Exposed to Radiation: Multiscale Theory, Simulations, and Experiment. Chemical reviews 2024, 124, 8014–8129. doi:10.1021/acs.chemrev.3c00902
  • Hari, S.; van Dorp, W. F.; Mulders, J. J. L.; Trompenaars, P. H. F.; Kruit, P.; Hagen, C. W. Sidewall angle tuning in focused electron beam-induced processing. Beilstein journal of nanotechnology 2024, 15, 447–456. doi:10.3762/bjnano.15.40
  • Szkudlarek, A.; Michalik, J. M.; Serrano-Esparza, I.; Nováček, Z.; Novotná, V.; Ozga, P.; Kapusta, C.; De Teresa, J. M. Graphene removal by water-assisted focused electron-beam-induced etching - unveiling the dose and dwell time impact on the etch profile and topographical changes in SiO2 substrates. Beilstein journal of nanotechnology 2024, 15, 190–198. doi:10.3762/bjnano.15.18
  • Höflich, K.; Hobler, G.; Allen, F. I.; Wirtz, T.; Rius, G.; McElwee-White, L.; Krasheninnikov, A. V.; Schmidt, M.; Utke, I.; Klingner, N.; Osenberg, M.; Córdoba, R.; Djurabekova, F.; Manke, I.; Moll, P.; Manoccio, M.; De Teresa, J. M.; Bischoff, L.; Michler, J.; De Castro, O.; Delobbe, A.; Dunne, P.; Dobrovolskiy, O. V.; Frese, N.; Gölzhäuser, A.; Mazarov, P.; Koelle, D.; Möller, W.; Pérez-Murano, F.; Philipp, P.; Vollnhals, F.; Hlawacek, G. Roadmap for focused ion beam technologies. Applied Physics Reviews 2023, 10. doi:10.1063/5.0162597
  • Mason, N. J.; Pintea, M.; Csarnovics, I.; Fodor, T.; Szikszai, Z.; Kertész, Z. Structural Analysis of Si(OEt)4 Deposits on Au(111)/SiO2 Substrates at the Nanometer Scale Using Focused Electron Beam-Induced Deposition. ACS omega 2023, 8, 24233–24246. doi:10.1021/acsomega.3c00793
  • Castillo-Robles, S.; Ponce-Pérez, R.; Paez-Ornelas, J.; Hoat, D.; Reyes-Serrato, A.; Guerrero-Sanchez, J. Furfural adsorption on the g-C3N4 monolayer: A DFT analysis. Materials Today Communications 2023, 35, 106288. doi:10.1016/j.mtcomm.2023.106288
  • Jurczyk, J.; Höflich, K.; Madajska, K.; Berger, L.; Brockhuis, L.; Edwards, T. E. J.; Kapusta, C.; Szymańska, I. B.; Utke, I. Ligand Size and Carbon-Chain Length Study of Silver Carboxylates in Focused Electron-Beam-Induced Deposition. Nanomaterials (Basel, Switzerland) 2023, 13, 1516. doi:10.3390/nano13091516
  • Priebe, A.; Michler, J. Review of Recent Advances in Gas-Assisted Focused Ion Beam Time-of-Flight Secondary Ion Mass Spectrometry (FIB-TOF-SIMS). Materials (Basel, Switzerland) 2023, 16, 2090. doi:10.3390/ma16052090
  • Kuprava, A.; Huth, M. Fast and Efficient Simulation of the FEBID Process with Thermal Effects. Nanomaterials (Basel, Switzerland) 2023, 13, 858. doi:10.3390/nano13050858
  • Prosvetov, A.; Verkhovtsev, A. V.; Sushko, G.; Solov'yov, A. V. Atomistic modeling of thermal effects in focused electron beam-induced deposition of Me$$_2$$Au(tfac). The European Physical Journal D 2023, 77. doi:10.1140/epjd/s10053-023-00598-5
  • Gökırmak Söğüt, E.; Gülcan, M. Adsorption: basics, properties, and classification. Adsorption through Advanced Nanoscale Materials; Elsevier, 2023; pp 3–21. doi:10.1016/b978-0-443-18456-7.00001-8
  • Dobrovolskiy, O. V.; Pylypovskyi, O. V.; Skoric, L.; Fernández-Pacheco, A.; Van Den Berg, A.; Ladak, S.; Huth, M. Complex-Shaped 3D Nanoarchitectures for Magnetism and Superconductivity. Topics in Applied Physics; Springer International Publishing, 2022; pp 215–268. doi:10.1007/978-3-031-09086-8_5
  • Prosvetov, A.; Verkhovtsev, A. V.; Sushko, G.; Solov'yov, A. V. Atomistic simulation of the FEBID-driven growth of iron-based nanostructures. Physical chemistry chemical physics : PCCP 2022, 24, 10807–10819. doi:10.1039/d2cp00809b
  • Utke, I.; Swiderek, P.; Höflich, K.; Madajska, K.; Jurczyk, J.; Martinović, P.; Szymańska, I. Coordination and organometallic precursors of group 10 and 11: Focused electron beam induced deposition of metals and insight gained from chemical vapour deposition, atomic layer deposition, and fundamental surface and gas phase studies. Coordination Chemistry Reviews 2022, 458, 213851. doi:10.1016/j.ccr.2021.213851
  • Bilgilisoy, E.; Yu, J.-C.; Preischl, C.; McElwee-White, L.; Steinrück, H.-P.; Marbach, H. Nanoscale Ruthenium-Containing Deposits from Ru(CO)4I2via Simultaneous Focused Electron Beam-Induced Deposition and Etching in Ultrahigh Vacuum: Mask Repair in Extreme Ultraviolet Lithography and Beyond. ACS Applied Nano Materials 2022, 5, 3855–3865. doi:10.1021/acsanm.1c04481
  • Elbadawi, C.; Kianinia, M.; Bendavid, A.; Lobo, C. J. Charged Particle Induced Etching and Functionalization of Two-Dimensional Materials. ECS Journal of Solid State Science and Technology 2022, 11, 35011–035011. doi:10.1149/2162-8777/ac5eb2
  • Huth, M.; Porrati, F.; Barth, S. Living up to its potential—Direct-write nanofabrication with focused electron beams. Journal of Applied Physics 2021, 130, 170901. doi:10.1063/5.0064764
  • Pablo-Navarro, J.; Sangiao, S.; Magén, C.; de Teresa, J. M. Magnetic Functionalization of Scanning Probes by Focused Electron Beam Induced Deposition Technology. Magnetochemistry 2021, 7, 140. doi:10.3390/magnetochemistry7100140
Other Beilstein-Institut Open Science Activities