Cite the Following Article
Focused particle beam-induced processing
Michael Huth and Armin Gölzhäuser
Beilstein J. Nanotechnol. 2015, 6, 1883–1885.
https://doi.org/10.3762/bjnano.6.191
How to Cite
Huth, M.; Gölzhäuser, A. Beilstein J. Nanotechnol. 2015, 6, 1883–1885. doi:10.3762/bjnano.6.191
Download Citation
Citation data can be downloaded as file using the "Download" button or used for copy/paste from the text window
below.
Citation data in RIS format can be imported by all major citation management software, including EndNote,
ProCite, RefWorks, and Zotero.
Citations to This Article
Up to 20 of the most recent references are displayed here.
Scholarly Works
- Kopyra, J.; Abdoul-Carime, H. Fragmentation of metal(II) bis(acetylacetonate) complexes induced by slow electrons. Beilstein journal of nanotechnology 2023, 14, 980–987. doi:10.3762/bjnano.14.81
- Kuprava, A.; Huth, M. Fast and Efficient Simulation of the FEBID Process with Thermal Effects. Nanomaterials (Basel, Switzerland) 2023, 13, 858. doi:10.3390/nano13050858
- Kopyra, J.; Rabilloud, F.; Abdoul-Carime, H. Interaction of Slow Electrons with Thermally Evaporated Manganese(II) Acetylacetonate Complexes. The journal of physical chemistry. A 2020, 124, 2186–2192. doi:10.1021/acs.jpca.9b10119
- Indrajith, S.; Rousseau, P.; Huber, B. A.; Nicolafrancesco, C.; Domaracka, A.; Grygoryeva, K.; Nag, P.; Sedmidubská, B.; Fedor, J.; Kočišek, J. Decomposition of Iron Pentacarbonyl Induced by Singly and Multiply Charged Ions and Implications for Focused Ion Beam-Induced Deposition. The Journal of Physical Chemistry C 2019, 123, 10639–10645. doi:10.1021/acs.jpcc.9b00289
- Zhou, Y.-B.; Fox, D.; Zhang, H. Helium Ion Microscopy for Two-Dimensional Materials. NanoScience and Technology; Springer International Publishing, 2016; pp 245–262. doi:10.1007/978-3-319-41990-9_11
