Correction: Formation of pure Cu nanocrystals upon post-growth annealing of Cu–C material obtained from focused electron beam induced deposition: comparison of different methods

Aleksandra Szkudlarek; Alfredo Rodrigues Vaz; Yucheng Zhang; Andrzej Rudkowski; Czesław Kapusta; Rolf Erni; Stanislav Moshkalev; Ivo Utke

doi:10.3762/bjnano.6.196

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Correction: Formation of pure Cu nanocrystals upon post-growth annealing of Cu–C material obtained from focused electron beam induced deposition: comparison of different methods

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¹Empa, Swiss Federal Laboratories for Materials Science and Technology, Laboratory for Mechanics of Materials and Nanostructures, Feuerwerkerstrasse 39, 3602 Thun, Switzerland

²AGH University of Science and Technology, Academic Centre for Materials and Nanotechnology, al. A. Mickiewicza 30, 30-059 Krakow, Poland

³Center for Semiconductor Components, State University of Campinas, 13083-870, Campinas, SP, Brazil

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This article is part of the Thematic Series "Focused electron beam induced processing".

Guest Editor: M. Huth
Beilstein J. Nanotechnol. 2015, 6, 1935–1936. https://doi.org/10.3762/bjnano.6.196
Received 25 Aug 2015, Accepted 04 Sep 2015, Published 21 Sep 2015

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This correction refers to Beilstein J. Nanotechnol. 2015, 6, 1508–1517. doi:10.3762/bjnano.6.156

Keywords: Cu(hfac)₂; Cu nanocrystals; focused electron beam induced deposition (FEBID); post-growth annealing of Cu–C material

In Figure 8 of the original article, the scale of the ordinate was wrong. The correct figure looks as follows:

[2190-4286-6-196-1] — **Figure 1:** **Figure 8 in the original article:** Calculated resistivity from the resistance measurement of a Cu–C line during in situ post-growth heating with a hot plate (red dots) and cooling down (blue dots) inside the SEM chamber. The resistance did not change when opening the chamber. The top SEM images show the morphology changes of an adjacent FEBID line which was observed simultaneously during the in situ resistance measurement.

**Figure 1:** **Figure 8 in the original article:** Calculated resistivity from the resistance measurement of a Cu–C ...

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© 2015 Szkudlarek et al; licensee Beilstein-Institut.
This is an Open Access article under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/2.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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Focused particle beam-induced processing

Michael Huth and Armin Gölzhäuser

aromatic	the word “aromatic”
aromatic aldehyde	the word “aromatic” OR “aldehyde”
+aromatic +aldehyde	both words “aromatic” AND “aldehyde”
+aromatic -aldehyde	the word “aromatic” but NOT “aldehyde”
“aromatic aldehyde”	the exact phrase “aromatic aldehyde”
benz*	words which begin with “benz”, such as “benzene” or “benzyl”
benz*yl	words that begin with “benz” and end with “yl”, such as “benzyl” or “benzoyl”
benzyl~	words that are close to the word “benzyl”, such as “benzoyl” (i.e., fuzzy search)