Cite the Following Article
High Ion/Ioff current ratio graphene field effect transistor: the role of line defect
Mohammad Hadi Tajarrod and Hassan Rasooli Saghai
Beilstein J. Nanotechnol. 2015, 6, 2062–2068.
https://doi.org/10.3762/bjnano.6.210
How to Cite
Tajarrod, M. H.; Saghai, H. R. Beilstein J. Nanotechnol. 2015, 6, 2062–2068. doi:10.3762/bjnano.6.210
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