Cite the Following Article
Large area scanning probe microscope in ultra-high vacuum demonstrated for electrostatic force measurements on high-voltage devices
Urs Gysin, Thilo Glatzel, Thomas Schmölzer, Adolf Schöner, Sergey Reshanov, Holger Bartolf and Ernst Meyer
Beilstein J. Nanotechnol. 2015, 6, 2485–2497.
https://doi.org/10.3762/bjnano.6.258
How to Cite
Gysin, U.; Glatzel, T.; Schmölzer, T.; Schöner, A.; Reshanov, S.; Bartolf, H.; Meyer, E. Beilstein J. Nanotechnol. 2015, 6, 2485–2497. doi:10.3762/bjnano.6.258
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