Influence of spurious resonances on the interaction force in dynamic AFM

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• de, N. F. S.; Ruppert, M. G.; Yong, Y. K.; Fleming, A. J. Integrated force and displacement sensing in active microcantilevers for off-resonance tapping mode atomic force microscopy. In 2020 International Conference on Manipulation, Automation and Robotics at Small Scales (MARSS), IEEE, 2020; pp 1–6. doi:10.1109/marss49294.2020.9307881
• Desbiolles, B. X. E.; Furlan, G.; Schwartzberg, A. M.; Ashby, P. D.; Ziegler, D. Electrostatically actuated encased cantilevers. Beilstein journal of nanotechnology 2018, 9, 1381–1389. doi:10.3762/bjnano.9.130
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• Costa, L.; Rodrigues, M.; Benseny-Cases, N.; Mayeux, V.; Chevrier, J.; Comin, F. Spectroscopic investigation of local mechanical impedance of living cells. PloS one 2014, 9, e101687. doi:10.1371/journal.pone.0101687

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