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A scanning probe microscope for magnetoresistive cantilevers utilizing a nested scanner design for large-area scans
Tobias Meier, Alexander Förste, Ali Tavassolizadeh, Karsten Rott, Dirk Meyners, Roland Gröger, Günter Reiss, Eckhard Quandt, Thomas Schimmel and Hendrik Hölscher
Beilstein J. Nanotechnol. 2015, 6, 451–461.
https://doi.org/10.3762/bjnano.6.46
How to Cite
Meier, T.; Förste, A.; Tavassolizadeh, A.; Rott, K.; Meyners, D.; Gröger, R.; Reiss, G.; Quandt, E.; Schimmel, T.; Hölscher, H. Beilstein J. Nanotechnol. 2015, 6, 451–461. doi:10.3762/bjnano.6.46
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