Graphene on SiC(0001) inspected by dynamic atomic force microscopy at room temperature

Mykola Telychko, Jan Berger, Zsolt Majzik, Pavel Jelínek and Martin Švec
Beilstein J. Nanotechnol. 2015, 6, 901–906. https://doi.org/10.3762/bjnano.6.93

Cite the Following Article

Graphene on SiC(0001) inspected by dynamic atomic force microscopy at room temperature
Mykola Telychko, Jan Berger, Zsolt Majzik, Pavel Jelínek and Martin Švec
Beilstein J. Nanotechnol. 2015, 6, 901–906. https://doi.org/10.3762/bjnano.6.93

How to Cite

Telychko, M.; Berger, J.; Majzik, Z.; Jelínek, P.; Švec, M. Beilstein J. Nanotechnol. 2015, 6, 901–906. doi:10.3762/bjnano.6.93

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