Cite the Following Article
Numerical investigation of depth profiling capabilities of helium and neon ions in ion microscopy
Patrick Philipp, Lukasz Rzeznik and Tom Wirtz
Beilstein J. Nanotechnol. 2016, 7, 1749–1760.
https://doi.org/10.3762/bjnano.7.168
How to Cite
Philipp, P.; Rzeznik, L.; Wirtz, T. Beilstein J. Nanotechnol. 2016, 7, 1749–1760. doi:10.3762/bjnano.7.168
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- Kim, S.; Trofimov, A. A.; Khanom, F.; Stern, L.; Lamberti, W. A.; Colby, R. J.; Abmayr, D.; Belianinov, A.; Ovchinnikova, O. S. High Resolution Multimodal Chemical Imaging Platform for Organics and Inorganics. Analytical chemistry 2019, 91, 12142–12148. doi:10.1021/acs.analchem.9b03377
- Wirtz, T.; De Castro, O.; Audinot, J.-N.; Philipp, P. Imaging and Analytics on the Helium Ion Microscope. Annual review of analytical chemistry (Palo Alto, Calif.) 2019, 12, 523–543. doi:10.1146/annurev-anchem-061318-115457
- Klingner, N.; Heller, R.; Hlawacek, G.; Facsko, S.; von Borany, J. Time-of-flight secondary ion mass spectrometry in the helium ion microscope. Ultramicroscopy 2018, 198, 10–17. doi:10.1016/j.ultramic.2018.12.014
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- Eswara, S.; Audinot, J.-N.; Adib, B. E.; Guennou, M.; Wirtz, T.; Philipp, P. Defect formation in multiwalled carbon nanotubes under low-energy He and Ne ion irradiation. Beilstein journal of nanotechnology 2018, 9, 1951–1963. doi:10.3762/bjnano.9.186
- Stehling, N.; Masters, R. C.; Zhou, Y.; O'Connell, R. F.; Holland, C.; Zhang, H.; Rodenburg, C. New perspectives on nano-engineering by secondary electron spectroscopy in the helium ion and scanning electron microscope. MRS Communications 2018, 8, 226–240. doi:10.1557/mrc.2018.75
