Advanced atomic force microscopy techniques III

Thilo Glatzel and Thomas Schimmel
Beilstein J. Nanotechnol. 2016, 7, 1052–1054. https://doi.org/10.3762/bjnano.7.98

Cite the Following Article

Advanced atomic force microscopy techniques III
Thilo Glatzel and Thomas Schimmel
Beilstein J. Nanotechnol. 2016, 7, 1052–1054. https://doi.org/10.3762/bjnano.7.98

How to Cite

Glatzel, T.; Schimmel, T. Beilstein J. Nanotechnol. 2016, 7, 1052–1054. doi:10.3762/bjnano.7.98

Download Citation

Citation data can be downloaded as file using the "Download" button or used for copy/paste from the text window below.
Citation data in RIS format can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Zotero.

Presentation Graphic

Picture with graphical abstract, title and authors for social media postings and presentations.
Format: PNG Size: 131.7 KB Download

Citations to This Article

Up to 20 of the most recent references are displayed here.

Scholarly Works

  • Ashtikar, M.; Wacker, M. G. Nanopharmaceuticals for wound healing – Lost in translation?. Advanced drug delivery reviews 2018, 129, 194–218. doi:10.1016/j.addr.2018.03.005
Other Beilstein-Institut Open Science Activities