Supporting Information
Supporting Information File 1: The supporting information illustrates the fitting model used in the evaluation of the relative intensities of the reflection peaks obtained in grazing incidence X-ray diffraction and presents all PL spectra measured using the excitation power and temperature dependencies for samples A and B. | ||
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Cite the Following Article
Substrate and Mg doping effects in GaAs nanowires
Perumal Kannappan, Nabiha Ben Sedrine, Jennifer P. Teixeira, Maria R. Soares, Bruno P. Falcão, Maria R. Correia, Nestor Cifuentes, Emilson R. Viana, Marcus V. B. Moreira, Geraldo M. Ribeiro, Alfredo G. de Oliveira, Juan C. González and Joaquim P. Leitão
Beilstein J. Nanotechnol. 2017, 8, 2126–2138.
https://doi.org/10.3762/bjnano.8.212
How to Cite
Kannappan, P.; Sedrine, N. B.; Teixeira, J. P.; Soares, M. R.; Falcão, B. P.; Correia, M. R.; Cifuentes, N.; Viana, E. R.; Moreira, M. V. B.; Ribeiro, G. M.; de Oliveira, A. G.; González, J. C.; Leitão, J. P. Beilstein J. Nanotechnol. 2017, 8, 2126–2138. doi:10.3762/bjnano.8.212
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