Modelling focused electron beam induced deposition beyond Langmuir adsorption

Dédalo Sanz-Hernández and Amalio Fernández-Pacheco
Beilstein J. Nanotechnol. 2017, 8, 2151–2161. https://doi.org/10.3762/bjnano.8.214

Supporting Information

Supporting Information File 1: Additional information on the model.
Analytical solution of the steady state model and a guide for the calculation of characteristic frequencies.
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Supporting Information File 2: FEBID frequency tool.
A spreadsheet for the quick calculation of characteristic frequencies.
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Modelling focused electron beam induced deposition beyond Langmuir adsorption
Dédalo Sanz-Hernández and Amalio Fernández-Pacheco
Beilstein J. Nanotechnol. 2017, 8, 2151–2161. https://doi.org/10.3762/bjnano.8.214

How to Cite

Sanz-Hernández, D.; Fernández-Pacheco, A. Beilstein J. Nanotechnol. 2017, 8, 2151–2161. doi:10.3762/bjnano.8.214

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