Cite the Following Article
Thin SnOx films for surface plasmon resonance enhanced ellipsometric gas sensing (SPREE)
Daniel Fischer, Andreas Hertwig, Uwe Beck, Volkmar Lohse, Detlef Negendank, Martin Kormunda and Norbert Esser
Beilstein J. Nanotechnol. 2017, 8, 522–529.
https://doi.org/10.3762/bjnano.8.56
How to Cite
Fischer, D.; Hertwig, A.; Beck, U.; Lohse, V.; Negendank, D.; Kormunda, M.; Esser, N. Beilstein J. Nanotechnol. 2017, 8, 522–529. doi:10.3762/bjnano.8.56
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- Fischer, D.; Hertwig, A.; Beck, U.; Lohse, V.; Negendank, D.; Kormunda, M.; Esser, N. Thin SnOx films for surface plasmon resonance enhanced ellipsometric gas sensing (SPREE). Beilstein journal of nanotechnology 2017, 8, 522–529. doi:10.3762/bjnano.8.56
