Supporting Information
| Supporting Information File 1: Additional SEM and AFM measurements, a description of the resistivity reconstruction method, derivation of the transmission line method, and details about the simulation and fit of temperature profiles. | ||
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Cite the Following Article
Combined scanning probe electronic and thermal characterization of an indium arsenide nanowire
Tino Wagner, Fabian Menges, Heike Riel, Bernd Gotsmann and Andreas Stemmer
Beilstein J. Nanotechnol. 2018, 9, 129–136.
https://doi.org/10.3762/bjnano.9.15
How to Cite
Wagner, T.; Menges, F.; Riel, H.; Gotsmann, B.; Stemmer, A. Beilstein J. Nanotechnol. 2018, 9, 129–136. doi:10.3762/bjnano.9.15
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