Supporting Information
Imaging speed: 0.5 s/frame, 10 × 5 nm2, 500 × 250 pix2. Three images were selected and are shown in Figure 9a.
| Supporting Information File 1: Successive FM-AFM images of calcite surface obtained in water. | ||
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Cite the Following Article
Quantitative comparison of wideband low-latency phase-locked loop circuit designs for high-speed frequency modulation atomic force microscopy
Kazuki Miyata and Takeshi Fukuma
Beilstein J. Nanotechnol. 2018, 9, 1844–1855.
https://doi.org/10.3762/bjnano.9.176
How to Cite
Miyata, K.; Fukuma, T. Beilstein J. Nanotechnol. 2018, 9, 1844–1855. doi:10.3762/bjnano.9.176
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Citations to This Article
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Scholarly Works
- Miyata, K.; Adachi, K.; Miyashita, N.; Miyazawa, K.; Foster, A. S.; Fukuma, T. High-Speed Three-Dimensional Scanning Force Microscopy Visualization of Subnanoscale Hydration Structures on Dissolving Calcite Step Edges. Nano letters 2024, 24, 10842–10849. doi:10.1021/acs.nanolett.4c02368
- Yang, C.; Dang, C.-Q.; Zhu, W.-L.; Ju, B.-F. High-speed atomic force microscopy in ultra-precision surface machining and measurement: challenges, solutions and opportunities. Surface Science and Technology 2023, 1. doi:10.1007/s44251-023-00006-5
- Miyata, K.; Kawagoe, Y.; Miyashita, N.; Nakagawa, T.; Fukuma, T. Atomic-scale structures and dynamics at the growing calcite step edge investigated by high-speed frequency modulation atomic force microscopy. Faraday discussions 2022, 235, 551–561. doi:10.1039/d1fd00084e
- Wang, C.; Li, Y.; Lin, R.; Cheng, P.; Xu, Z.; Qian, J.; Dou, Z.; Wang, J.; Li, L. A novel amplitude and frequency demodulation algorithm for frequency-modulation atomic force microscope. Measurement Science and Technology 2021, 32, 125001. doi:10.1088/1361-6501/ac1b42
- Miyata, K.; Takeuchi, K.; Kawagoe, Y.; Spijker, P.; Tracey, J.; Foster, A. S.; Fukuma, T. High-Speed Atomic Force Microscopy of the Structure and Dynamics of Calcite Nanoscale Etch Pits. The journal of physical chemistry letters 2021, 12, 8039–8045. doi:10.1021/acs.jpclett.1c02088
- Fukuma, T. Improvements in fundamental performance of in-liquid frequency modulation atomic force microscopy. Microscopy (Oxford, England) 2020, 69, 340–349. doi:10.1093/jmicro/dfaa045
- Emilienne, L.; Zhang, J.; Rodrigue, D. N. S. Research on V2G Participating in Power System Frequency Control. In 2019 IEEE 7th International Conference on Smart Energy Grid Engineering (SEGE), IEEE, 2019; pp 230–234. doi:10.1109/sege.2019.8859938
- Miyata, K.; Kawagoe, Y.; Tracey, J.; Miyazawa, K.; Foster, A. S.; Fukuma, T. Variations in Atomic-Scale Step Edge Structures andDynamics of Dissolving Calcite in Water Revealed by High-Speed FrequencyModulation Atomic Force Microscopy. The Journal of Physical Chemistry C 2019, 123, 19786–19793. doi:10.1021/acs.jpcc.9b05788
- Koskin, E.; Bisiaux, P.; Galayko, D.; Blokhina, E. NEWCAS - All-Digital Phase-Locked Loop Arrays: Investigation of Synchronisation and Jitter Performance through FPGA Prototyping. In 2019 17th IEEE International New Circuits and Systems Conference (NEWCAS), IEEE, 2019; pp 1–4. doi:10.1109/newcas44328.2019.8961269
- Wagner, T. Steady-state and transient behavior in dynamic atomic force microscopy. Journal of Applied Physics 2019, 125, 044301. doi:10.1063/1.5078954
Patents
- OGAWA JUNYA; MATSUI KATSUAKI. Semiconductor device. US 11728815 B2, Aug 15, 2023.
- OGAWA JUNYA; MATSUI KATSUAKI. SEMICONDUCTOR DEVICE. US 20220085818 A1, March 17, 2022.
