Supporting Information
Additional SEM images of inner and outermost zones, CWT calculations about how the L:S affects the DE, SEM images of zones before and after the Pt deposition, and imaging simulations for modified and non-modified FZPs.
Supporting Information File 1: Additional experimental data. | ||
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Cite the Following Article
High-throughput synthesis of modified Fresnel zone plate arrays via ion beam lithography
Kahraman Keskinbora, Umut Tunca Sanli, Margarita Baluktsian, Corinne Grévent, Markus Weigand and Gisela Schütz
Beilstein J. Nanotechnol. 2018, 9, 2049–2056.
https://doi.org/10.3762/bjnano.9.194
How to Cite
Keskinbora, K.; Sanli, U. T.; Baluktsian, M.; Grévent, C.; Weigand, M.; Schütz, G. Beilstein J. Nanotechnol. 2018, 9, 2049–2056. doi:10.3762/bjnano.9.194
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