Combined pulsed laser deposition and non-contact atomic force microscopy system for studies of insulator metal oxide thin films

Daiki Katsube, Hayato Yamashita, Satoshi Abo and Masayuki Abe
Beilstein J. Nanotechnol. 2018, 9, 686–692. https://doi.org/10.3762/bjnano.9.63

Cite the Following Article

Combined pulsed laser deposition and non-contact atomic force microscopy system for studies of insulator metal oxide thin films
Daiki Katsube, Hayato Yamashita, Satoshi Abo and Masayuki Abe
Beilstein J. Nanotechnol. 2018, 9, 686–692. https://doi.org/10.3762/bjnano.9.63

How to Cite

Katsube, D.; Yamashita, H.; Abo, S.; Abe, M. Beilstein J. Nanotechnol. 2018, 9, 686–692. doi:10.3762/bjnano.9.63

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