Transition from silicene monolayer to thin Si films on Ag(111): comparison between experimental data and Monte Carlo simulation

Alberto Curcella, Romain Bernard, Yves Borensztein, Silvia Pandolfi and Geoffroy Prévot
Beilstein J. Nanotechnol. 2018, 9, 48–56. https://doi.org/10.3762/bjnano.9.7

Cite the Following Article

Transition from silicene monolayer to thin Si films on Ag(111): comparison between experimental data and Monte Carlo simulation
Alberto Curcella, Romain Bernard, Yves Borensztein, Silvia Pandolfi and Geoffroy Prévot
Beilstein J. Nanotechnol. 2018, 9, 48–56. https://doi.org/10.3762/bjnano.9.7

How to Cite

Curcella, A.; Bernard, R.; Borensztein, Y.; Pandolfi, S.; Prévot, G. Beilstein J. Nanotechnol. 2018, 9, 48–56. doi:10.3762/bjnano.9.7

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  • Pandolfi, S.; Zhao, S.; Turner, J.; Ercius, P.; Song, C.; Dhall, R.; Menguy, N.; Le Godec, Y.; Courac, A.; Minor, A. M.; Eggert, J.; Dresselhaus-Marais, L. E. Multi-scale characterization of hexagonal Si-4H: a hierarchical nanostructured material. 2021.
  • Curcella, A.; Bernard, R.; Borensztein, Y.; Resta, A.; Lazzeri, M.; Prévot, G. Structure and stability of silicene on Ag(111) reconstructions from grazing incidence x-ray diffraction and density functional theory. Physical Review B 2019, 99, 205411. doi:10.1103/physrevb.99.205411
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