This search combines search strings from the content search (i.e. "Full Text", "Author", "Title", "Abstract", or "Keywords") with "Article Type" and "Publication Date Range" using the AND operator.
Beilstein J. Nanotechnol. 2024, 15, 733–742, doi:10.3762/bjnano.15.61
Figure 1: Schematic drawing of the focused ion beam milling induced by the incident ion beam (a) as well as m...
Figure 2: Averaged sputtering yield shown together with the dependences of Yi(θ′) for Ga ions with an energy...
Figure 3: Plan-view SEM (a, e) and cross-sectional STEM (b–d, f–h) images with the superimposed simulation re...
Figure 4: Experimentally obtained (a–c) and simulated (d–f) elemental maps of the oxygen atom distribution in...