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Beilstein J. Nanotechnol. 2017, 8, 813–825, doi:10.3762/bjnano.8.84
Figure 1: Test grating. a) Lattice features given by the manufacturer. b) Scanning electron microscopy image ...
Figure 2: Top panel: AFM profiles of a 60 × 60 μm2 portion of the microcrystalline diamond film: (a,b) before...
Figure 3: Left: Sub-micrometer protrusions on the pyramids of the multi-scaled rough diamond surface; reprodu...
Figure 4: Scanning electron microscopy image of a mercury drop attached to a tipless cantilever obtained with...
Figure 5: a) Schematics of the mercury drop–surface system in an AFM. D is the actual distance between mercur...
Figure 6: Pull-off force vs contact length; the red dash straight line is a guide to the eye. Right inset: A ...
Figure 7: Results for pull-off force measurements carried out along different surfaces. The pull-off force be...
Figure 8: Statistics of the whole set of pull-off force measurements. Distribution of the pull-off force betw...
Figure 9: Adhesion force vs contact length between the array of sharp silicon peaks and (a) a hollow glass sp...
Figure 10: Distribution of the number of contacts with the array of sharp peaks: a) The number of contacts mad...
Figure 11: a) Distribution of the number of contacts of the multi-scaled rough diamond surface with the mercur...