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Beilstein J. Nanotechnol. 2015, 6, 893–900, doi:10.3762/bjnano.6.92
Figure 1: Surface relief of the GeTiO film after laser irradiation with 100 laser pulses at 15 mJ/cm2 fluence...
Figure 2: Low-magnification XTEM images of the amorphous GeTiO film, before (a) and after (b) laser irradiati...
Figure 3: XTEM images of the amorphous GeTiO RF film after laser irradiation with 266 nm laser radiation. (a)...
Figure 4: Morphology details of the GeTiO film surface layer structure revealed by the cross sectional observ...
Figure 5: STEM-HAADF image (left) and a detail from the same image correlated with line scan EDX analyse (rig...
Figure 6: Size distribution of the Ge nanoparticles in region II of the laser transformed layer. The distribu...
Figure 7: EDX spectra collected on the cross section specimen with an electron beam of 50 nm diameter. (a) Sp...
Figure 8: Temperature estimation for different depths beneath the GeTiO film surface during the laser pulse a...
Figure 9: Crystallization (a) and subsequent crystal growth (b) of the Ge amorphous nanoparticle under the hi...
Figure 10: High-resolution TEM images comparing details of the initial crystallized particle (a) and the same ...