1 article(s) from Hu, Yifan

Enhancing higher-order modal response in multifrequency atomic force microscopy with a coupled cantilever system

  • Wendong Sun,
  • Jianqiang Qian,
  • Yingzi Li,
  • Yanan Chen,
  • Zhipeng Dou,
  • Rui Lin,
  • Peng Cheng,
  • Xiaodong Gao,
  • Quan Yuan and
  • Yifan Hu

Beilstein J. Nanotechnol. 2024, 15, 694–703, doi:10.3762/bjnano.15.57

Graphical Abstract
PDF
Album
Supp Info
Full Research Paper
Published 17 Jun 2024
 
Other Beilstein-Institut Open Science Activities