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Beilstein J. Nanotechnol. 2025, 16, 54–56, doi:10.3762/bjnano.16.6
Beilstein J. Nanotechnol. 2019, 10, 771–773, doi:10.3762/bjnano.10.76
Beilstein J. Nanotechnol. 2012, 3, 637–650, doi:10.3762/bjnano.3.73
Figure 1: Schematic drawings illustrating data-acquisition procedures employed to record the atomic-scale sur...
Figure 2: Isometric (a) and top (b) views of a piezoelectric scan tube employed as a precise positioning tool...
Figure 3: Schematic drawing describing the elastic deformation/bending of an asymmetric tip apex as the tip–s...
Figure 4: Planar three-layer tip apex models used in the analytical simulations, featuring close-packed atoms...
Figure 5: Illustrations of the model surfaces investigated in this section. (a) The Cu(001) surface in FCC co...
Figure 6: Simulated 2-D force fields over a Cu(001) surface along the [100] direction probed by symmetric (a:...
Figure 7: Simulated 2-D force fields over the NaCl(001) surface along the [110] direction probed by a symmetr...
Figure 8: 2-D force fields over the NaCl(001) surface simulated using parameters identical to the correspondi...