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Beilstein J. Nanotechnol. 2024, 15, 1353–1361, doi:10.3762/bjnano.15.108
Figure 1: Photographs of structures taken with an optical microscope. (a) Chip with samples A1–A4 and (b) sam...
Figure 2: SEM image of the edge of the Hf/Ti bridge structure made with the lift-off process.
Figure 3: The dependence of resistance versus temperature (black dots) for the test samples: (a) A1, (b) A2, ...
Figure 4: The temperature dependence of resistance of sample C1 (blue squares), sample A4 (red triangles), an...
Figure 5: The temperature and resistance relation for sample A4 and its fits with the Aslamazov–Larkin formul...
Figure 6: (a) Dependence of normalized derivatives δR/δT versus T/TC ratio for samples C1 (green curve) and A...
Figure 7: TES characteristics calculated from the parameters of sample A4. (a) Ampere–watt sensitivity and (b...
Figure 8: Energy resolution δE as a function of TES square edge length.
Beilstein J. Nanotechnol. 2024, 15, 26–36, doi:10.3762/bjnano.15.3
Figure 1: (a) A view of the matrix of dipole antennas with integrated CEBs. (b) Enlarged view of the receivin...
Figure 2: Frequency response of the two-frequency receiving system based on the matrix of bow-tie antennas wi...
Figure 3: (a) Design of the sample of LSPE VB 210/240 from the SINS1 series. (b) Optical photo of the sample ...
Figure 4: (a) SEM image of the LSPE sample; bow-tie antennas are visible. (b) SEM image where the required el...
Figure 5: I–V characteristics of two receiving structures of a sample receiving system from the LSPE VB 210/2...
Figure 6: Measured frequency responses of two receiving structures of a receiving system prototype from the L...
Figure 7: Noise spectra of a sample receiving system from the LSPE VB 210/240 SINS1 series 240 GHz array. To ...